CapeSym, Inc.

Press Release - October 20, 2017 2:19PM EST

CapeSym Introduces New Dual-Mode Radiation Detector Having FOM From 5 to 20

CapeSym Introduces New Dual-Mode Radiation Detector Having FOM From 5 to 20

CapeSym's new RadSolver(TM) dual-mode radiation detector offers enhanced neutron/gamma signal separation for the highest FOM on the market. The composite can be optimized for sensitivity, resolution, timing, and neutron type to meet application-specific requirements. Moreover, the RadSolver is available in multiple form factors suitable for hand-held, backpack, portal and other applications.

CapeSym, Inc. announced today that they are offering new RadSolver(TM) gamma/neutron dual modality product line with ultra-high figure-of-merit(FOM), for high-confidence measurement. The enhanced n,g signal separation provides the highest FOM on the market.  The composite can be engineered for sensitivity, resolution, timing, and neutron type to meet application-specific requirements. Moreover, the RadSolver(TM) is compact, and available in multiple form factors suitable f  or hand-held, backpack, portal and other applications. It is offered as plug-and-play kit, or as an OEM solution pre-assembled with a PMT or solid state photosensors, with appropriate electronics, for your accelerated development. The cost-effective, fully-integrated gamma detectors are made at their Natick, MA, USA manufacturing facility.

Key features:

•FOM from 5 to 20

"We predict the RadSolver will be a game changer. Not only is it cost-effective, compact, and customizable, but the neutron-gamma PSD is highly separated and will not collapse in rugged environments." Stacy Swider, Sr. Scientist

•Tailorable thermal or fast neutron sensitivity

•Thermal neutron sensitivity from 3 to 300 cps/nv

•Energy resolution as good as 3% at 662 keV

•Application specific design options

For more information, including a full pdf brochure, please visit their website at www.capesym.com, or email sales@capesym.com.

The unit will be demonstrated next week at the IEEE NSS MIC 2017 conference in Atlanta, GA --- October 24-26, 2017.

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